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Device Model: ST31000528AS
Serial Number: 9VP7FFG0
LU WWN Device Id: 5 000c50 022dfa9b2
Firmware Version: CC38
User Capacity: 1б═000б═204б═886б═016 bytes [1,00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sat Dec 21 18:40:22 2013 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.

General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 609) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 181) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x103f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 120 082 006 Pre-fail Always - 236414198
3 Spin_Up_Time 0x0003 094 094 000 Pre-fail Always - 0
4 Start_Stop_Count 0x0032 037 037 020 Old_age Always - 65535
5 Reallocated_Sector_Ct 0x0033 051 051 036 Pre-fail Always - 2047
7 Seek_Error_Rate 0x000f 087 060 030 Pre-fail Always - 4879736765
9 Power_On_Hours 0x0032 071 071 000 Old_age Always - 25511
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 073 073 020 Old_age Always - 27781
183 Runtime_Bad_Block 0x0032 094 094 000 Old_age Always - 6
184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0
187 Reported_Uncorrect 0x0032 001 001 000 Old_age Always - 3679
188 Command_Timeout 0x0032 100 098 000 Old_age Always - 25770197134
189 High_Fly_Writes 0x003a 066 066 000 Old_age Always - 34
190 Airflow_Temperature_Cel 0x0022 077 043 045 Old_age Always In_the_past 23 (0 50 24 20 0)
194 Temperature_Celsius 0x0022 023 057 000 Old_age Always - 23
195 Hardware_ECC_Recovered 0x001a 042 020 000 Old_age Always - 236414198
197 Current_Pending_Sector 0x0012 092 085 000 Old_age Always - 354
198 Offline_Uncorrectable 0x0010 092 085 000 Old_age Offline - 354
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 2
240 Head_Flying_Hours 0x0000 100 253 000 Old_age Offline - 21397527095013
241 Total_LBAs_Written 0x0000 100 253 000 Old_age Offline - 536401483
242 Total_LBAs_Read 0x0000 100 253 000 Old_age Offline - 939982943

SMART Error Log Version: 1
ATA Error Count: 276 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 276 occurred at disk power-on lifetime: 25355 hours (1056 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 ff ff ff ef 00 31d+09:57:53.855 READ DMA EXT
35 00 18 ff ff ff ef 00 31d+09:57:53.854 WRITE DMA EXT
35 00 18 ff ff ff ef 00 31d+09:57:53.854 WRITE DMA EXT
35 00 08 ff ff ff ef 00 31d+09:57:53.854 WRITE DMA EXT
35 00 10 ff ff ff ef 00 31d+09:57:53.853 WRITE DMA EXT

Error 275 occurred at disk power-on lifetime: 25355 hours (1056 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 ff ff ff ef 00 31d+09:57:50.446 READ DMA EXT
25 00 08 ff ff ff ef 00 31d+09:57:50.445 READ DMA EXT
25 00 08 ff ff ff ef 00 31d+09:57:50.445 READ DMA EXT
25 00 08 ff ff ff ef 00 31d+09:57:50.434 READ DMA EXT
25 00 08 ff ff ff ef 00 31d+09:57:50.413 READ DMA EXT

Error 274 occurred at disk power-on lifetime: 25355 hours (1056 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 ff ff ff ef 00 31d+09:57:47.197 READ DMA EXT
25 00 00 ff ff ff ef 00 31d+09:57:47.156 READ DMA EXT
25 00 00 ff ff ff ef 00 31d+09:57:47.146 READ DMA EXT
25 00 00 ff ff ff ef 00 31d+09:57:47.039 READ DMA EXT
25 00 00 ff ff ff ef 00 31d+09:57:47.033 READ DMA EXT

Error 273 occurred at disk power-on lifetime: 25186 hours (1049 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 ff ff ff ef 00 24d+09:49:44.358 READ DMA EXT
ea 00 00 ff ff ff af 00 24d+09:49:44.357 FLUSH CACHE EXT
27 00 00 00 00 00 e0 00 24d+09:49:44.356 READ NATIVE MAX ADDRESS EXT
ec 00 00 00 00 00 a0 00 24d+09:49:44.348 IDENTIFY DEVICE
ef 03 46 00 00 00 a0 00 24d+09:49:44.341 SET FEATURES [Set transfer mode]

Error 272 occurred at disk power-on lifetime: 25186 hours (1049 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 ff ff ff ef 00 24d+09:49:41.096 READ DMA EXT
35 00 30 ff ff ff ef 00 24d+09:49:41.095 WRITE DMA EXT
25 00 08 ff ff ff ef 00 24d+09:49:41.095 READ DMA EXT
c8 00 08 d0 d2 08 e0 00 24d+09:49:41.074 READ DMA
35 00 08 ff ff ff ef 00 24d+09:49:41.073 WRITE DMA EXT

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 90% 25484 1542371867

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.